Location: MIC-Arena, Maria-Goeppert-Str 1a, 23562 Lübeck
Title: Using Sampling theory for Resolution Estimation in emission tomography
Abstract: In classical X-Ray tomography, resolution limits for given sampling geometries can easily be derived using Shannon's Sampling Theorem and some Fourier framework. Unfortunately, this method does not succeed in emission tomography, even when assuming straight line approximations, since it does not take into account decreasing photon counts and thus dropping SNR when passing to smaller detectors. In order to make classical results useful again, we need to do some extra stochastic modeling which takes into account the Poisson character of the measured data. We show that using some (possibly unjustified) simplifications, the combined analysis can actually be carried out and leads to estimates of the resolution. As a demonstration object, we look at the combined analysis of a slat collimator SPECT device that was proposed and built by Philips and find that, at least in this case, it leads to useful results.
